Rainier Client Coverage & Content

Read Coverage

EBN: Shared Data Mitigates Supply Chain Cost of Electronics Counterfeiting

Shared Data Migration Mitigates Supply Chain Cost of Electronics Counterfeiting

Electronics counterfeiting is gaining attention as evidenced by the recent IEEE International Symposium on Hardware Oriented Security and Trust chaired by Professor Mark Tehranipoor.  More than 250 industry and academic leaders attended the conference to address the growing threat that counterfeit devices are posing to the security of the electronics supply chain.  Inadvertent use of recycled, refurbished, or re-marked components can result in significant business risk for a manufacturer’s customers, resulting in unwanted returns and damage to their brand value.

Read Coverage

EBN: Cross-Organizational Data Sharing in the Auto Supply Chain Reduces Defects

Cross-Organizational Data Sharing in the Auto Supply Chain Reduces Defects

For years, semiconductor manufacturers have leveraged manufacturing data throughout their globally-dispersed supply chains to improve quality and reduce return material authorizations (RMAs). Automotive OEMs and Tier 1 suppliers are now working to meet the similar challenge of reducing defective parts per million (DPPM) and beyond in vehicle production. The ability to share and connect data backwards and forwards throughout the supply chain is now seen as a key capability to address this challenge. How can sharing data throughout the automotive supply chain reduce DPPM?

Read Coverage

EDN: Move ICs from defects per million to defects per billion

Move ICs from defects per million to defects per billion

Defective Parts Per Million (DPPM) is one of the key metrics used to measure quality in many semiconductor segments. With electronics becoming more and more a part of everyday life (wearable electronics and semi-autonomous vehicles), there's increasing pressure to improve quality across all semiconductor market segments. For mission-critical segments such as automotive and medical, market forces are driving improvements in quality into the Defective Parts Per Billion (DPPB) range.

Read Coverage

EBN: Enable Supply Chain Security Through an Authentication Data Network

Enable Supply Chain Security Through an Authentication Data Network

Electronics counterfeiting is gaining attention as evidenced by the recent IEEE International Symposium on Hardware Oriented Security & Trust (HOST).  More than 250 industry and academic leaders attended the conference to address the growing threat that counterfeit devices are posing to the security of the electronics supply chain.  Inadvertent use of recycled, refurbished, or re-marked components can result in significant business risk for a manufacturer's customers, resulting in unwanted returns and damage to their brand value.

Read Coverage

Big Data Forum: Repurpose Data That is Traditionally Deleted

Repurpose Data That is Traditionally Deletede

Data generated from manufacturing processes has traditionally been seen as one-time use information. It streamed through control systems and used to make corrections, counts, and other short term uses. Storage of this data was thought to be a waste of resources. Those assumptions are being rethought in light of facilities now being employed by other forms of big data.

Read Coverage

Electronic Design: True Big Data to Be Showcased at ITC 2015

True Big Data to Be Showcased at ITC 2015

If you’re a fabless IC company looking to optimize production, or are generally interested in the practical application of big data, then you should definitely stop by and see Marc Jacobs’ presentation at the International Test Conference next week.

Read Coverage

TAP Times: To Test or Not to Test? (that is the question)

To Test or Not to Test?  (That is the Question)

It's no secret that global semiconductor companies spend a significant amount of timeand resources on manufacturing and that shows no sign of changing soon.