Cross-Organizational Data Sharing in the Auto Supply Chain Reduces Defects
For years, semiconductor manufacturers have leveraged manufacturing data throughout their globally-dispersed supply chains to improve quality and reduce return material authorizations (RMAs). Automotive OEMs and Tier 1 suppliers are now working to meet the similar challenge of reducing defective parts per million (DPPM) and beyond in vehicle production. The ability to share and connect data backwards and forwards throughout the supply chain is now seen as a key capability to address this challenge. How can sharing data throughout the automotive supply chain reduce DPPM?
Move ICs from defects per million to defects per billion
Defective Parts Per Million (DPPM) is one of the key metrics used to measure quality in many semiconductor segments. With electronics becoming more and more a part of everyday life (wearable electronics and semi-autonomous vehicles), there's increasing pressure to improve quality across all semiconductor market segments. For mission-critical segments such as automotive and medical, market forces are driving improvements in quality into the Defective Parts Per Billion (DPPB) range.
Real-time adaptive test algorithm can safely reduce wafer testing time and cost
The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both a plant’s production throughput and production costs.